Many improvements have been made by Nikon Metrology in its new 225 kV micro-focus X-ray CT (computed tomography) system: the XT H 225 ST 2x. According to the company, two of the new features are not present in any other industrial CT system. One is ‘Rotating.Target 2.0’, which thanks to more efficient cooling enables a 3x smaller focal spot size for clearer imaging. The other, ‘Half.Turn CT’, is a novel method for almost halving the angle through which a specimen rotates during the X-ray cycle, speeding the process without loss of image quality.

Operation is greatly simplified and efficiency doubled, enhancing the system’s suitability for a range of applications. The intrinsic benefit of X-ray CT is that it allows both the non-destructive inspection and measurement of a sample’s exterior and interior. Nikon Metrology’s XT H 225 ST 2x, which has undergone thousands of hours of rigorous testing, is distinguished by its ability to be tuned in line with the part under investigation so that optimal results are produced every time.

Rotating.Target 2.0 maximises the quality of data collected and hence image resolution. This feature also doubles the running time before preventive maintenance is required, lowering costs and raising equipment availability. Spinning the target dissipates the heat generated by the small focal spot size more efficiently, enabling continuous generation of high-power X rays and an increase in scanning speed and resolution, without the need for cool-down.

Another new feature is Local.Calibration, which allows rapid, repeatable, automated calibration of voxel size at any CT scan position, rather than the user having to perform the function manually. This leads to a radical improvement in measurement accuracy. Extra benefits are that the procedure is de-skilled and dimensional accuracy is traceable.

For further information
www.nikonmetrology.com